We specialise in high reliability custom packaging elements for critical programs and offer a broad product portfolio including different semiconductors, power modules and RF transistors. Another aspect of the present invention is a method for testing a semiconductor device comprising coupling that the semiconductor device to the rear side of a circuit board comprising circuitry adapted to supply an actual operating environment for the semiconductor apparatus; and operating the circuitry onto the circuit board.
In the method embodying the principles of the present invention, a typical semiconductor device, indicated generally at 10 in the drawing, is put in An evaluation socket 12. Although this discussion is led to the testing of a particular semiconductor apparatus it’ll be understood that any semiconductor device having at least one PN junction therein could be tested by this method.
The device 10 further comprises a plastic body 16 which overlies and substantially encircles the semiconductor processor 15 and also the heat sink 14. A plurality of terminals 18, 20 and 22 extend from 1 end 24 of the body 16. These leads are internally linked to the semiconductor chip 15 inside the body 16. In this example, the semiconductor device 10 is a transistor and the terminals 18, 20 and 22 correspond to connections made to a base region, a collector area and an emitter region, respectively, of the semiconductor processor 15. Most of the time, the collector area of the semiconductor processor 15 is mounted directly to the heat sink 14 and to one of the terminals 20.
The signal applied to the non-inverting input of comparator 108 is a reference ion derived from diode stack 60. Thus, if the voltage proportional to the leakage current through the device under test exceeds the reference voltage at the anode terminal of diode pile 60, the comparator will generate an output signal indicative of excess leakage.
A semiconductor curve tracer is a specialised piece of electronic test equipment utilized to analyze the characteristics of discrete semiconductor devices like diodes , transistors , and thyristors According to an oscilloscope , the device also comprises voltage and current sources which may be employed to stimulate the device under test (DUT).
1 aspect of the present invention is a method for testing a semiconductor device containing a circuit board comprising circuitry adapted to offer a real operating environment for the semiconductor device, the circuit board with Mspecllc.com a front side and a rear side; and examine terminals formed on the back side of the circuit board and also organized to pair the semiconductor device to the circuit board.
As explained above, an evaluation system for semiconductor apparatus according to the present invention tests apparatus by coupling them into the back side of a circuit board, thereby eliminating interference using CPUs (not shown) or other peripheral elements like the add-in boards 41 a, 41 b in FIG.